An efficient built-in self test method for robust path delay fault testing
نویسندگان
چکیده
Single Input Change (SIC) testing has been proposed for robust path delay fault testing. In this letter a new Built-In Self Test (BIST) method for SIC vector generation is presented. The proposed method compares favourably to the previously proposed methods for SIC pattern generation with respect to hardware overhead and time required for completion of the test.
منابع مشابه
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ورودعنوان ژورنال:
- J. Electronic Testing
دوره 8 شماره
صفحات -
تاریخ انتشار 1996